Airport Pavement Papers & Publications

Analysis of Falling Weight Deflectometer Tests at Denver International Airport

Presented at the 2002 Federal Aviation Administration Airport Technology Transfer Conference. Authors: May Dong, Gordon F. Hayhoe


Implementation of Rigid Pavement Thickness Design - New Pavement

Presented at the 2002 Federal Aviation Administration Airport Technology Transfer Conference. Authors: Izydor Kawa, Edward H. Guo, Gordon F. Hayhoe, David R. Brill


Comparison Between Falling-Weight Deflectometer and Static Deflection Measurements on Flexible Pavements at the National Airport Pavement Test

Presented at the 2002 Federal Aviation Administration Airport Technology Transfer Conference. Authors: Navneet Garg, Wayne H. Marsey


Analysis of NAPTF Traffic Test Data for the First-Year Rigid Pavement Test Items

Presented at the 2002 Federal Aviation Administration Airport Technology Transfer Conference. Authors: Edward H. Guo, Gordon F. Hayhoe, David R. Brill


Subgrade Strains Measured in Full-Scale Traffic Tests With Four- and Six-Wheel Landing Gears

Presented at the 2002 Federal Aviation Administration Airport Technology Transfer Conference. Author: Gordon F. Hayhoe, Navneet Garg


LEAF – A New Layered Elastic Computational Program for FAA Pavement Design and Evaluation Procedures

Presented at the 2002 Federal Aviation Administration Airport Technology Transfer Conference. Author: Gordon F. Hayhoe


Report of Strain Gage Verification Tests for the National Airport Pavement Test Facility

Submitted by Construction Technology Laboratories, Inc 5420 Old Orchard Road Skokie, Ill. 60077


Asphalt Concrete Strain Responses at High Loads and Low Speeds At the National Airport Pavement Test Facility (NAPTF)

Authors: Navneet Garg and Gordon F. Hayhoe


Slow-Rolling Response Tests on the Test Pavements at the National Airport Pavement Test Facility (NAPTF)

Authors: Gordon F. Hayhoe, Robert Cornwell, Navneet Garg


Verification of Curling In PCC Slabs At FAA National Airport Pavement Test Facility

Authors: Edward H. Guo, Wayne Marsey


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